The half-size mid-bus probe supports both 2.5 GT/s and 5.0 GT/s PCI Express data rates.
Traditional PCI Express in the computer system typically has connections through a slot connector with easy probing solutions. Space constraints dictate the test and debug strategy for any given design. The Agilent N5328A half-size mid-bus probe for PCIe 2.0 offers a method to probe these embedded signals effortlessly.
Our flying leads probe is designed for space-constrained systems, said Jun Chie, marketing manager of Agilent’s Logic and Protocol Test business. In conjunction with our powerful protocol analyzer, the half-size mid-bus probe will allow designers to monitor the PCI Express protocol with a probe that is much more compact. This reduces routing concerns and simplifies the board layout.
Agilent’s half-size mid-bus probe is designed with reliable and consistent signals in mind and includes the following features:
— With its very low capacity loading, it enables insight without influencing the monitored signals;
— Soft touch, micro-spring pin technology provides reliable contact to signal pads even when probing uneven or contaminated board surfaces; and
— Top-side retention module eliminates the need to access the back of the board.
Agilent will enable reliable monitoring and debugging of the PCIe 2.0 link. With the introduction of the half-size mid-bus probe, Agilent provides an industry-unique probe portfolio for PCIe 2.0, including the full-size mid-bus probe (straight, swizzle and split styles available), slot interposer probe, flying leads probe and now the N5328A half-size mid-bus probe. Agilent’s probing capabilities are combined with a powerful PCIe 2.0 analyzer, with a reliable data capture engine, easy-to-use graphical user interface and a versatile form factor, making Agilent’s E2960B Series the leader in the industry for PCI Express 2.0 test and debugging.
